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隨著高速運算、高速傳輸、低延遲、低耗能的先進功能晶片需求越大，製程微縮技術變得愈來愈困難，因此異質整合成為IC晶片的創新動能，滿足高效低成本設計的Chiplets也跟著崛起。💪💪
Cadence產品市場總監孫自君接受新電子雜誌採訪表示: 實現Chiplets系統在設計上仍有許多挑戰，例如如何確保中介層和封裝的設計正確，使訊號和電源完整性成為正確運行的必要條件。
為此，Cadence備有Sigrity工具，可以協助設計人員進行訊號完整性和電源完整性分析，另外還有Virtuoso平台，從電性感知布局演進至業電性和模擬驅動布局，以確保電路完整性及效能...😉😉
詳全文>>http://sc.piee.pw/MYDHS
Talk Announcement-9/18 Friday 10am, Prof. Shawn Blanton from CMU
Date/Time：2015/09/18(Fri) AM10:00-12:00
Venue： Engineering Bldg. 4, ED 528
Speaker： Prof. Shawn Blanton
Dept. of Electrical and Computer Engineering, Carnegie Mellon University
Topic: Improving Design, Manufacturing, and Even Test through Test-Data Mining
Abstract: Since yield is not 100%, the main objective of manufacturing test has and continues to be screening out “bad” ICs. Today, however, test is being used to provide valuable information about failing chips, answering questions about whether the design, the fabrication process or some combination of the two is responsible for failure. The information extracted is, ideally, used to improve design, fabrication and even test itself. In this talk, an overview of research in the Carnegie Mellon Advanced Chip Testing Laboratory (http://www.ece.cmu.edu/~actl) in this area will be described. Experiment results from manufactured chips from both integrated device manufacturers (e.g., IBM) and chip-design houses (e.g., Nvidia) will be used to illustrate the utility of the described approaches.
Speaker's brief bio: Shawn Blanton is a professor in the Department of Electrical and Computer Engineering at Carnegie Mellon University where he formerly served as director of the Center for Silicon System Implementation, an organization that consisted of 18 faculty members and over 80 students that focused on the design and manufacture of silicon-based systems. He currently serves as the Associate Director of the SYSU-CMU Joint Institute of Engineering (JIE, http://jie.cmu.edu/). He received the Bachelor's degree in engineering from Calvin College in 1987, a Master's degree in Electrical Engineering in 1989 from the University of Arizona, and a Ph.D. degree in Computer Science and Engineering from the University of Michigan, Ann Arbor in 1995.
Professor Blanton’s research interests are housed in the Advanced Chip Testing Laboratory (ACTL, www.ece.cmu.edu/~actl) and include the design, verification, test and diagnosis of integrated, heterogeneous systems. He has published many papers in these areas and has several issued and pending patents in the area of IC test and diagnosis. Prof. Blanton has received the National Science Foundation Career Award for the development of a microelectromechanical systems (MEMS) testing methodology and two IBM Faculty Partnership Awards. He is a Fellow of the IEEE, and is the recipient of the 2006 Emerald Award for outstanding leadership in recruiting and mentoring minorities for advanced degrees in science and technology.
Your attendance is most welcome!
Aileen Yu 游雅玲
EECS International Graduate Program
National Chiao Tung University
http://eecsigp.nctu.edu.tw/
Tel:+886-3-5131290, +886-3-5712121 ext:54019
Email:[email protected]
